THERMAL-WAVE IMAGING IN A SCANNING ELECTRON-MICROSCOPE

被引：0

|

作者：

ROSENCWAIG, A ^{[1
]}

机构：

[1] THERMA INC, FREMONT, CA 94539 USA

来源：

SCANNING ELECTRON MICROSCOPY | 1984年

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：1611 / 1628

页数：18

相关论文

共 50 条

[1] THERMAL-WAVE IMAGING IN A SCANNING ELECTRON-MICROSCOPE
ROSENCWAIG, A
ANNUAL REVIEW OF MATERIALS SCIENCE, 1985, 15 : 103 - 118
[2] THERMAL-WAVE IMAGING IN A SCANNING ELECTRON-MICROSCOPE
ROSENCWAIG, A
ACS SYMPOSIUM SERIES, 1986, 295 : 253 - 266
[3] THERMAL-WAVE IMAGING IN A SCANNING ELECTRON MICROSCOPE.
Rosencwaig, A.
Scanning Electron Microscopy, 1984, (pt 4) : 1611 - 1628
[4] THERMAL-WAVE MICROSCOPY - A NEW APPLICATION OF THE SCANNING ELECTRON-MICROSCOPE
BRANDIS, EK
IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1981, 28 (05): : 362 - 362
[5] IMAGING STRATEGY IN THE SCANNING ELECTRON-MICROSCOPE
NEWBURY, DE
SCANNING ELECTRON MICROSCOPY, 1981, : 71 - 78
[6] ELECTRON-MICROSCOPE TRANSMISSION ELECTRON-MICROSCOPE AND SCANNING ELECTRON-MICROSCOPE
WATANABE, T
DENKI KAGAKU, 1986, 54 (08): : 667 - 670
[7] SCANNING ELECTRON-MICROSCOPE ATTACHMENT FOR ELECTRON-MICROSCOPE
MIYAUCHI, K
WATANABE, T
KUBOZOE, M
JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 256 - 256
[8] IMAGING WITH BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE
ROBINSON, VNE
SCANNING, 1980, 3 (01) : 15 - 26
[9] ENHANCED TOPOGRAPHY IMAGING IN THE SCANNING ELECTRON-MICROSCOPE
GRIFFIN, NS
MEASUREMENT SCIENCE AND TECHNOLOGY, 1994, 5 (11) : 1403 - 1406
[10] REFLECTION ELECTRON-MICROSCOPE IMAGING OF AN OPERATING SCANNING TUNNELING MICROSCOPE
KUWABARA, M
LO, W
SPENCE, JCH
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04): : 2745 - 2751

← 1 2 3 4 5 →