CRYSTALLOGRAPHIC EVALUATION OF ZNSE CRYSTALS BY X-RAY-DIFFRACTION

被引：4
|
作者：
OKUNO, Y [1 ]
TAMURA, H [1 ]
MARUYAMA, T [1 ]
机构：
[1] KANAGAWA ACAD SCI & TECHNOL,TAKATSU KU,KAWASAKI,KANAGAWA 213,JAPAN
来源：
JOURNAL OF ELECTRONIC MATERIALS | 1993年 / 22卷 / 06期
关键词：
LATTICE CONSTANT; X-RAY DIFFRACTION; ZNSE CRYSTAL;
D O I：
10.1007/BF02666418
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Crystallographic quality and the lattice constant of ZnSe crystals grown from Te/Se solutions by the temperature gradient solution growth method were evaluated by using a high resolution x-ray diffractometer. The full width at half maximum of the x-ray rocking curve was 5.7 sec, a value almost equivalent to that of GaAs. The distribution of crystallographic properties along the growth direction was nearly the same excepting just on the heat-sink. The accurate lattice constant of the ZnSe crystal measured by this system was 5.6700 +/-0.000025 A.
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页码：685 / 688
页数：4
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