DISAPPEARANCE OF TOPOGRAPHICAL CONTRAST IN THE BACKSCATTERED ELECTRON IMAGE IN SCANNING ELECTRON-MICROSCOPY

被引：3
作者：
IKUTA, T
机构：
来源：
APPLIED PHYSICS LETTERS | 1983年 / 42卷 / 06期
关键词：
D O I：
10.1063/1.93995
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：533 / 534
页数：2
相关论文
共 5 条
[1]   MAGNETIC DOMAIN CONTRAST FROM CUBIC MATERIALS IN SCANNING ELECTRON-MICROSCOPE [J].
FATHERS, DJ ;
JAKUBOVICS, JP ;
JOY, DC .
PHILOSOPHICAL MAGAZINE, 1973, 27 (03) :765-768
[2]   MAGNETIC DOMAIN CONTRAST FROM FERROMAGNETIC MATERIALS IN SCANNING ELECTRON-MICROSCOPE [J].
IKUTA, T ;
SHIMIZU, R .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 23 (02) :605-613
[3]  
Philbert J., 1969, MICRON, V1, P174
[4]   MONTE-CARLO TECHNIQUE AS APPLIED TO FUNDAMENTALS OF EPMA AND SEM [J].
SHIMIZU, R ;
MURATA, K ;
IKUTA, T .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) :4233-&
[5]  
YAMOMOTO T, 1976, PHILOS MAG, V34, P311
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