COMPARISON OF MEAN TIME TO 1ST FAILURE AND MEAN UP TIME

被引：1

|

作者：

SINGH, C

ASGARPOOR, S

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1983年 / 23卷 / 01期

关键词：

D O I：

10.1016/0026-2714(83)91371-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：79 / 90

页数：12

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