THERMAL-OXIDATION OF UNDOPED LPCVD POLYCRYSTALLINE-SILICON FILMS

被引:8
作者
LU, CY
TSAI, NS
机构
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D O I
10.1149/1.2108596
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:446 / 447
页数:2
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[1]  
BALDI L, 1980, ELECTROCHEMICAL SOC, V80, P441
[2]   LOW-TEMPERATURE DIFFERENTIAL OXIDATION FOR DOUBLE POLYSILICON VLSI DEVICES [J].
BARNES, JJ ;
DEBLASI, JM ;
DEAL, BE .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (10) :1779-1785
[3]   GROWTH AND PHYSICAL-PROPERTIES OF LPCVD POLYCRYSTALLINE SILICON FILMS [J].
HARBEKE, G ;
KRAUSBAUER, L ;
STEIGMEIER, EF ;
WIDMER, AE ;
KAPPERT, HF ;
NEUGEBAUER, G .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (03) :675-682
[4]   OXIDATION OF PHOSPHORUS-DOPED LOW-PRESSURE AND ATMOSPHERIC-PRESSURE CVD POLYCRYSTALLINE-SILICON FILMS [J].
KAMINS, TI .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (05) :838-844
[5]   STRUCTURE AND PROPERTIES OF LPCVD SILICON FILMS [J].
KAMINS, TI .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) :686-690
[6]   THERMAL OXIDATION OF POLYCRYSTALLINE SILICON FILMS [J].
KAMINS, TI ;
MACKENNA, EL .
METALLURGICAL TRANSACTIONS, 1971, 2 (08) :2292-&
[7]   OXIDATION OF ARSENIC IMPLANTED POLYCRYSTALLINE SILICON [J].
KINSBRON, E ;
MURARKA, SP ;
SHENG, TT ;
LYNCH, WT .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (07) :1555-1560
[8]   THERMAL-OXIDATION OF HEAVILY PHOSPHORUS-DOPED THIN-FILMS OF POLYCRYSTALLINE SILICON [J].
SARASWAT, KC ;
SINGH, H .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (10) :2321-2326