EVALUATION OF A LIQUID-METAL ION-SOURCE FOR SECONDARY ION MASS-SPECTROMETRY

被引：10

作者：

GNASER, H ^{[1
]}

RUDENAUER, FG ^{[1
]}

机构：

[1] AUSTRIAN RES CTR SEIBERSDORF,A-1082 VIENNA,AUSTRIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)90995-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：303 / 306

页数：4

共 18 条

[1]

Castaing R., 1962, J MICROSCOPIE, V1, P395

[2]

GNASER H, NUCL INSTR METH

[3]

HIGATSBERGER MJ, 1982, SECONDARY ION MASS S, V3, P38

[4] ION-SOURCE OF HIGH BRIGHTNESS USING LIQUID-METAL [J].

KROHN, VE ;

RINGO, GR .

[5] ION MICROPROBE MASS ANALYZER [J].

LIEBL, H .

[6] BEAM OPTICS IN SECONDARY ION MASS-SPECTROMETRY [J].

LIEBL, H .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 187 (01) :143-151

PATKIN, AJ ;

MORRISON, GH .

[8]

PREWETT PD, 1980, I PHYS C SER, V54, P316

[9]

REUTER W, 1982, 9TH INT MASS SPECTR

[10]

RUDENAUER FG, 1981, MIKROCHIM ACTA, V2, P375