CRITICAL-REVIEW OF VISUAL INSPECTION

[1] ADAWAY WGL, 1983, P SOC PHOTO-OPT INST, V376, P103, DOI 10.1117/12.934733

[2] BAMLER R, 1983, OPTICAL PROCESSING, P153

[3] BARR A, 1982, HDB ARTIFICIAL INTEL, V3

[4] COMPUTATIONAL VISION [J]. PROCEEDINGS OF THE IEEE, 1981, 69 (05) : 572 - 595

[5] BARTLAM P, 1983, IND MACHINE VISION A, P247

[6] Batchelor B. G., 1979, IEE Journal on Computers and Digital Techniques, V2, P61, DOI 10.1049/ij-cdt.1979.0014

[7] BATCHELOR BG, 1983, SENSOR REV, V3, P12

[8] BATCHELOR BG, 1983, ILLUMINATION IMAGE A, P97

[9] CHEN MJ, 1982, P SOC PHOTO-OPT INST, V360, P287

[10] CHIN RT, 1978, P SPIE IMAGE UNDERST, V155, P199

[1] ADAWAY WGL, 1983, P SOC PHOTO-OPT INST, V376, P103, DOI 10.1117/12.934733

[2] BAMLER R, 1983, OPTICAL PROCESSING, P153

[3] BARR A, 1982, HDB ARTIFICIAL INTEL, V3

[4] COMPUTATIONAL VISION [J]. PROCEEDINGS OF THE IEEE, 1981, 69 (05) : 572 - 595

[5] BARTLAM P, 1983, IND MACHINE VISION A, P247

[6] Batchelor B. G., 1979, IEE Journal on Computers and Digital Techniques, V2, P61, DOI 10.1049/ij-cdt.1979.0014

[7] BATCHELOR BG, 1983, SENSOR REV, V3, P12

[8] BATCHELOR BG, 1983, ILLUMINATION IMAGE A, P97

[9] CHEN MJ, 1982, P SOC PHOTO-OPT INST, V360, P287

[10] CHIN RT, 1978, P SPIE IMAGE UNDERST, V155, P199