HOLE TRANSPORT AND TRAPPING IN FIELD OXIDES

被引：67
作者：
BOESCH, HE
MCLEAN, FB
机构：
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1985年 / 32卷 / 06期
关键词：
D O I：
10.1109/TNS.1985.4334047
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：3940 / 3945
页数：6
相关论文
共 14 条
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[8]   APPLICATION OF STOCHASTIC HOPPING TRANSPORT TO HOLE CONDUCTION IN AMORPHOUS SIO-2 [J].
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[10]  
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