SECONDARY-ION MASS-SPECTROMETRY IMAGING

被引：19
作者：
ODOM, RW
机构：
[1] Charles Evans & Associates, Redwood City, California
来源：
APPLIED SPECTROSCOPY REVIEWS | 1994年 / 29卷 / 01期
关键词：
D O I：
10.1080/05704929408000898
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
[No abstract available]
引用
收藏
页码：67 / 116
页数：50
相关论文
共 50 条
  • [21] IDENTIFICATION OF MODIFIED NUCLEOSIDES BY SECONDARY-ION MASS-SPECTROMETRY
    UNGER, SE
    SCHOEN, AE
    COOKS, RG
    ASHWORTH, DJ
    GOMES, JD
    CHANG, CJ
    [J]. JOURNAL OF ORGANIC CHEMISTRY, 1981, 46 (23) : 4765 - 4769
  • [22] PHOTOGRAPHIC GELATIN LAYER MICROSTRUCTURES REVEALED BY IMAGING SECONDARY-ION MASS-SPECTROMETRY
    CHABALA, JM
    LEVISETTI, R
    MATERNAGHAN, TJ
    [J]. JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY, 1995, 39 (03): : 222 - 232
  • [23] LIMITING FACTORS FOR SECONDARY-ION MASS-SPECTROMETRY PROFILING
    CIRLIN, EH
    VAJO, JJ
    HASENBERG, TC
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (01): : 269 - 275
  • [24] INSTRUMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY AND SECONDARY ION IMAGING MASS-SPECTROMETRY
    WERNER, HW
    [J]. VACUUM, 1972, 22 (11) : 613 - 617
  • [25] NEGATIVE METAL-ION SOURCE FOR SECONDARY-ION MASS-SPECTROMETRY
    YURIMOTO, H
    MORI, Y
    YAMAMOTO, H
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (05) : 1146 - 1149
  • [26] LIQUID SECONDARY-ION MASS-SPECTROMETRY FOURIER-TRANSFORM MASS-SPECTROMETRY OF OLIGOSACCHARIDE ANIONS
    CARROLL, JA
    NGOKA, L
    BEGGS, CG
    LEBRILLA, CB
    [J]. ANALYTICAL CHEMISTRY, 1993, 65 (11) : 1582 - 1587
  • [27] INSITU ION-IMPLANTATION FOR QUANTIFICATION IN SECONDARY-ION MASS-SPECTROMETRY
    GNASER, H
    [J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (4-5): : 507 - 510
  • [28] FAST-ATOM MOLECULAR SECONDARY-ION MASS-SPECTROMETRY
    ROSS, MM
    WYATT, JR
    COLTON, RJ
    CAMPANA, JE
    [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 54 (03): : 237 - 247
  • [29] APPLICATION OF SECONDARY-ION MASS-SPECTROMETRY TO THE ANALYSIS OF ENVIRONMENTAL OBJECTS
    BARBASHEV, SV
    PRISTER, BS
    VLASYUK, VI
    [J]. JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR, 1988, 43 (02): : 229 - 233
  • [30] SECONDARY-ION MASS-SPECTROMETRY AND ITS USE IN DEPTH PROFILING
    LIEBL, H
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 385 - 391
12345