SECONDARY-ION MASS-SPECTROMETRY IMAGING

被引：19
|
作者：
ODOM, RW
机构：
[1] Charles Evans & Associates, Redwood City, California
来源：
APPLIED SPECTROSCOPY REVIEWS | 1994年 / 29卷 / 01期
关键词：
D O I：
10.1080/05704929408000898
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
[No abstract available]
引用
收藏
页码：67 / 116
页数：50
相关论文
共 50 条
  • [1] SECONDARY-ION MASS-SPECTROMETRY
    ZALM, PC
    VACUUM, 1994, 45 (6-7) : 753 - 772
  • [2] SECONDARY-ION MASS-SPECTROMETRY
    GRASSERBAUER, M
    CHEMIE IN UNSERER ZEIT, 1994, 28 (05) : 222 - 232
  • [3] SECONDARY-ION MASS-SPECTROMETRY AND GEOLOGY
    MACRAE, ND
    CANADIAN MINERALOGIST, 1995, 33 : 219 - 236
  • [4] SECONDARY-ION MASS-SPECTROMETRY - FOREWORD
    BENTZ, BL
    ODOM, RW
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1995, 143 : R9 - R9
  • [5] SECONDARY-ION MASS-SPECTROMETRY OF PARTICLE BEAMS
    SANDERS, PE
    RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 1990, 4 (04) : 123 - 124
  • [6] SECONDARY-ION MASS-SPECTROMETRY OF GLYCOSYLATED PORPHYRINS
    SPIRO, M
    BLAIS, JC
    BOLBACH, G
    FOURNIER, F
    TABET, JC
    DRIAF, K
    GAUD, O
    GRANET, R
    KRAUSZ, P
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1994, 134 (2-3): : 229 - 238
  • [7] ORGANIC ION IMAGING BEYOND THE LIMIT OF STATIC SECONDARY-ION MASS-SPECTROMETRY
    MCMAHON, JM
    DOOKERAN, NN
    TODD, PJ
    JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 1995, 6 (11) : 1047 - 1058
  • [8] MICROANALYSIS USING SECONDARY-ION MASS-SPECTROMETRY
    LING, YC
    JOURNAL OF THE CHINESE CHEMICAL SOCIETY, 1994, 41 (03) : 329 - 333
  • [9] STUDIES OF ADHESION BY SECONDARY-ION MASS-SPECTROMETRY
    SPOOL, AM
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1994, 38 (04) : 391 - 411
  • [10] CHARACTERIZATION OF FLUID CRACKING CATALYSTS BY IMAGING SECONDARY-ION MASS-SPECTROMETRY
    LETA, DP
    KUGLER, EL
    ACS SYMPOSIUM SERIES, 1989, 411 : 354 - 364
12345