METHODOLOGICAL SOLUTIONS FOR THE ANALYSIS OF SEDIMENT SAMPLES BY DIRECT SAMPLE INSERTION INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION

被引:17
|
作者
BLAIN, L [1 ]
SALIN, ED [1 ]
机构
[1] MCGILL UNIV,DEPT CHEM,801 SHERBROOKE ST W,MONTREAL H3A 2K6,QUEBEC,CANADA
关键词
D O I
10.1016/0584-8547(92)80021-8
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Results for the calibration of the direct sample insertion technique (DSI) with sediment standards are reported for inductively coupled plasma atomic emission spectrometry (ICP-AES). It has been found that internal standardization can compensate for variations in volatilization interferences and changes in excitation conditions between sediment standards, for elements of high and intermediate volatility (Cd, Cu, Hg, Mn, Pb and Zn). It has also been found that the method of standard additions allows accurate calibration of the technique. Sub-ppm detection limits were typical for elements of high and intermediate volatility.
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页码:205 / 217
页数:13
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