A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY

被引:1342
作者
CLEVELAND, JP [1 ]
MANNE, S [1 ]
BOCEK, D [1 ]
HANSMA, PK [1 ]
机构
[1] DIGITAL INSTRUMENTS,SANTA BARBARA,CA 93103
关键词
D O I
10.1063/1.1144209
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The spring constant of microfabricated cantilevers used in scanning force microscopy (SFM) can be determined by measuring their resonant frequencies before and after adding small end masses. These masses adhere naturally and can be easily removed before using the cantilever for SFM, making the method nondestructive. The observed variability in spring constant-almost an order of magnitude for a single type of cantilever-necessitates calibration of individual cantilevers in work where precise knowledge of forces is required. Measurements also revealed that the spring constant scales with the cube of the unloaded resonant frequency, providing a simple way to estimate the spring constant for less precise work.
引用
收藏
页码:403 / 405
页数:3
相关论文
共 12 条
[1]   MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].
ALBRECHT, TR ;
AKAMINE, S ;
CARVER, TE ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396
[2]  
[Anonymous], UNPUB
[3]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[4]   ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
GERBER, C ;
STOLL, E ;
ALBRECHT, TR ;
QUATE, CF .
EUROPHYSICS LETTERS, 1987, 3 (12) :1281-1286
[5]  
BUTT HJ, IN PRESS MICROSC
[6]   DIRECT MEASUREMENT OF COLLOIDAL FORCES USING AN ATOMIC FORCE MICROSCOPE [J].
DUCKER, WA ;
SENDEN, TJ ;
PASHLEY, RM .
NATURE, 1991, 353 (6341) :239-241
[7]   MEASUREMENT OF FORCES IN LIQUIDS USING A FORCE MICROSCOPE [J].
DUCKER, WA ;
SENDEN, TJ ;
PASHLEY, RM .
LANGMUIR, 1992, 8 (07) :1831-1836
[8]  
ISRAELACHVILLI JN, 1981, J CHEM SOC F1, P975
[9]   NOVEL OPTICAL APPROACH TO ATOMIC FORCE MICROSCOPY [J].
MEYER, G ;
AMER, NM .
APPLIED PHYSICS LETTERS, 1988, 53 (12) :1045-1047
[10]  
SARID, 1991, SCANNING FORCE MICRO