TILT MEASUREMENT USING DIGITAL SPECKLE SHEAR INTERFEROMETRY

被引：7

作者：

SIROHI, RS ^{[1
]}

GANESAN, AR ^{[1
]}

TAN, BC ^{[1
]}

机构：

[1] UNIV MALAYA,INST ADV STUDIES,KUALA LUMPUR 59100,MALAYSIA

来源：

OPTICS AND LASER TECHNOLOGY | 1992年 / 24卷 / 05期

关键词：

INTERFEROMETRY; SPECKLE; MEASUREMENT;

D O I：

10.1016/0030-3992(92)90067-C

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Speckle shear interferometry is an established technique to measure derivatives of displacement components. It can also be used to measure the tilt of diffuse objects. Electronic detection with speckle shear interferometry makes it a real-time technique for tilt measurement. The paper describes the various shear types that could be used for this purpose.

引用

页码：257 / 261

页数：5

共 10 条

[1]

[Anonymous], 1983, HOLOGRAPHIC SPECKLE

[2]

Erf R. K., 1978, SPECKLE METROLOGY

[3] UNIVERSAL DIGITAL SPECKLE SHEARING INTERFEROMETER [J].

GANESAN, AR ;

SHARMA, DK ;

KOTHIYAL, MP .

APPLIED OPTICS, 1988, 27 (22) :4731-4734

[4]

KRISHNAMURTHY R, 1984, OPTIK, V67, P85

[5]

LOKBERG O, 1980, PHYS TECHNOL, V11, P16

[6] SPECKLE-SHEAR INTERFEROMETRY WITH DOUBLE DOVE PRISMS [J].

MOHANTY, RK ;

JOENATHAN, C ;

SIROHI, RS .

OPTICS COMMUNICATIONS, 1983, 47 (01) :27-30

[7] HIGH-SENSITIVITY TILT MEASUREMENT BY SPECKLE SHEAR INTERFEROMETRY [J].

MOHANTY, RK ;

JOENATHAN, C ;

SIROHI, RS .

APPLIED OPTICS, 1986, 25 (10) :1661-1664

[8] DIGITAL SPECKLE-PATTERN SHEARING INTERFEROMETRY [J].

NAKADATE, S ;

YATAGAI, T ;

SAITO, H .

APPLIED OPTICS, 1980, 19 (24) :4241-4246

[9]

SIROHI RS, 1984, J OPT, V113, P95

[10]

Vest CM., 1979, HOLOGRAPHIC INTERFER, V1

← 1 →