ANALYTICAL RELATIONS FOR THIN-FILM TOTAL INTERNAL-REFLECTION PHASE RETARDERS

被引：3
|
作者：
COJOCARU, E
机构：
[1] Laser Department, Institute of Atomic Physics, Magurele-Bucharest, RO-76900
来源：
APPLIED OPTICS | 1994年 / 33卷 / 31期
关键词：
THIN-FILM COATINGS; TOTAL INTERNAL REFLECTION PRISMS; PHASE RETARDERS;
D O I：
10.1364/AO.33.007425
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Single-layer coatings on total internal reflection boundaries that produce any specific phase retardation are analyzed. One- and two-reflection phase-retarding systems are considered. Simple quadratic equations are obtained for an unknown layer phase thickness at a given angle of incidence and phase retardation. Equations for specific multilayer coatings that are equivalent to single-layer designs are also deduced. Diagrams of solution zones for refractive indices are given comparatively for one- and two-reflection systems.
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页码：7425 / 7430
页数：6
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