Heat Transfer Characteristics in High Power LED Packaging

被引:9
作者
Chi-Hung Chung [1 ]
Kai-Shing Yang [2 ]
Kuo-Hsiang Chien [2 ]
Ming-Shan Jeng [2 ]
Ming-Tsang Lee [1 ]
机构
[1] Natl Chung Hsing Univ, Dept Mech Engn, Taichung, Taiwan
[2] Ind Technol Res Inst, Green Energy Environm Res Labs, Hsinchu, Taiwan
关键词
LED; Electronics packaging; Ceramic substrate; Spreading resistance;
D O I
10.1080/23080477.2014.11665596
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
This study uses the T3Ster transient thermal resistance measuring device to investigate the effects to heat transfer performances from different LED crystal grains, packaging methods and heat-sink substrates through the experimental method. The experimental parameters are six different types of LED modules that are made alternatively with the crystal grain structure, the die attach method and the carrying substrate. The crystal grain structure includes the lateral type, flip chip type and vertical type. The die attach method includes silver paste and the eutectic structure. The carrying substrates are aluminum oxide (Alumina) and aluminum nitride (AIN) ceramic substrates and metal core PCB (MCPCB). The experimental results show that, under the conditions of the same crystal grain and die attach method, the thermal resistance values for the AIN substrate and the Alumina substrate are 2.1K/W and 5.1K/W, respectively and the total thermal resistance values are 7.3K/W and 10.8K/W. Compared to the Alumina substrate, the AIN substrate can effectively lower the total thermal resistance value by 32.4%. This is because the heat transfer coefficient of the AIN substrate is higher than that of the Alumina substrate, thus effectively increasing its thermal conductivity. In addition, under the conditions of the same crystal grain and the same substrate, the packaging methods are using silver paste and the eutectic structure for die attach. Their thermal resistance values are 5.7K/W and 2.7K/W, respectively, with a variance of 3K/W. Comparisons of the crystal grain structure show that the thermal resistance for the flip chip type is lower than that of the traditional lateral type by 0.9K/W. This is because the light emitting layer of the flip chip crystal grain is closer to the heat-sink substrate, shortening the heat dissipation route, and thus lowering the thermal resistance value. For the total thermal resistance, the crystal grain structure has a lesser effect to the heat dissipation performance whereas the packaging method and the choice of the substrate have a relatively higher effect to the LED heat dissipation performance. Combining the above results, we see that selecting the flip chip crystal grain with a closer light emitting layer to the substrate, the eutectic structure that has better thermal conductivity and the AIN substrate can effectively increase the heat dissipation performance of the LED module.
引用
收藏
页码:1 / 6
页数:6
相关论文
共 12 条
[1]   Investigations of the thermal spreading effects of rectangular conduction plates and vapor chamber [J].
Chen, Yen-Shu ;
Chien, Kuo-Hsiang ;
Wang, Chi-Chuan ;
Hung, Tzu-Chen ;
Ferng, Yuh-Ding ;
Pei, Bau-Shei .
JOURNAL OF ELECTRONIC PACKAGING, 2007, 129 (03) :348-355
[2]   Determination of Optimized Rectangular Spreader Thickness for Lower Thermal Spreading Resistance [J].
Chen, Yen-Shu ;
Chien, Kuo-Hsiang ;
Tseng, Yung-Shin ;
Chan, Yea-Kuang .
JOURNAL OF ELECTRONIC PACKAGING, 2009, 131 (01) :0110041-0110048
[3]   Failure modes and effects analysis for high-power GaN-based light-emitting diodes package technology [J].
Horng, Ray-Hua ;
Lin, Re-Ching ;
Chiang, Yi-Chen ;
Chuang, Bing-Han ;
Hu, Hung-Lieh ;
Hsu, Chen-Peng .
MICROELECTRONICS RELIABILITY, 2012, 52 (05) :818-821
[4]   Optimized Thermal Management From a Chip to a Heat Sink for High-Power GaN-Based Light-Emitting Diodes [J].
Horng, Ray-Hua ;
Hong, Jhih-Sin ;
Tsai, Yu-Li ;
Wuu, Dong-Sing ;
Chen, Chih-Ming ;
Chen, Chia-Ju .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2010, 57 (09) :2203-2207
[5]   Thermal transient characteristics of die attach in high power LED PKG [J].
Kim, Hyun-Ho ;
Choi, Sang-Hyun ;
Shin, Sang-Hyun ;
Lee, Young-Ki ;
Choi, Seok-Moon ;
Yi, Sung .
MICROELECTRONICS RELIABILITY, 2008, 48 (03) :445-454
[6]   Improvement of thermal management of high-power GaN-based light-emitting diodes [J].
Liou, Bo-Hung ;
Chen, Chih-Ming ;
Horng, Ray-Hua ;
Chiang, Yi-Chen ;
Wuu, Dong-Sing .
MICROELECTRONICS RELIABILITY, 2012, 52 (05) :861-865
[7]   Solid-state lighting: failure analysis of white LEDs [J].
Narendran, N ;
Gu, Y ;
Freyssinier, JP ;
Yu, H ;
Deng, L .
JOURNAL OF CRYSTAL GROWTH, 2004, 268 (3-4) :449-456
[8]   Experimental performance of a heat pipe [J].
Said, SA ;
Akash, BA .
INTERNATIONAL COMMUNICATIONS IN HEAT AND MASS TRANSFER, 1999, 26 (05) :679-684
[9]   High brightness GaN vertical light emitting diodes on metal alloyed substrate for general lighting application [J].
Tran, Chuong Anh ;
Chu, Chen-Fu ;
Cheng, Chao-Chen ;
Liu, Wen-Huan ;
Chu, Jiunn-Yi ;
Cheng, Hao-Chun ;
Fan, Feng-Hsu ;
Yen, Jui-Kang ;
Doan, Trung .
JOURNAL OF CRYSTAL GROWTH, 2007, 298 :722-724
[10]   An experimental study on the heat dissipation of LED lighting module using metal/carbon foam [J].
Yang, Kai-Shing ;
Chung, Chi-Hung ;
Lee, Ming-Tsang ;
Chiang, Song-Bor ;
Wong, Cheng-Chou ;
Wang, Chi-Chuan .
INTERNATIONAL COMMUNICATIONS IN HEAT AND MASS TRANSFER, 2013, 48 :73-79