STUDY OF ELECTRONIC LEVELS IN ANTIMONY AND INDIUM-DOPED GALLIUM-ARSENIDE

被引:34
作者
MITCHEL, WC [1 ]
YU, PW [1 ]
机构
[1] WRIGHT STATE UNIV, RES CTR, DAYTON, OH 45435 USA
关键词
D O I
10.1063/1.334751
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:623 / 625
页数:3
相关论文
共 16 条
[1]   DISLOCATION-FREE GAAS AND INP CRYSTALS BY ISOELECTRONIC DOPING [J].
JACOB, G ;
DUSEAUX, M ;
FARGES, JP ;
VANDENBOOM, MMB ;
ROKSNOER, PJ .
JOURNAL OF CRYSTAL GROWTH, 1983, 61 (02) :417-424
[2]  
JACOB G, 1982, SEMIINSULATING 3 5 M, P2
[3]   STUDY OF 2 DIFFERENT DEEP LEVELS IN UNDOPED LEC SI-GAAS BY PHOTO-LUMINESCENCE SPECTROSCOPY [J].
KIKUTA, T ;
TERASHIMA, K ;
ISHIDA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (07) :L409-L411
[4]  
KIKUTA T, 1983, JPN J APPL PHYS, V22, pL539
[5]   DEFECT NATURE OF THE 0.4-EV CENTER IN O-DOPED GAAS [J].
LOOK, DC ;
CHAUDHURI, S ;
SIZELOVE, JR .
APPLIED PHYSICS LETTERS, 1983, 42 (09) :829-831
[6]  
RYTOVA NS, 1982, SOV PHYS SEMICOND+, V16, P951
[7]   IMPURITY EFFECT ON GROWN-IN DISLOCATION DENSITY OF INP AND GAAS CRYSTALS [J].
SEKI, Y ;
WATANABE, H ;
MATSUI, J .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (02) :822-828
[8]  
SOLOVEVA EV, 1981, SOV PHYS SEMICOND+, V15, P1243
[9]  
SOLOVEVA EV, 1982, SOV PHYS SEMICOND+, V16, P366
[10]  
TA LB, 1983, INST PHYS CONF SER, P31