DIGITAL COINCIDENCE DETECTION - A SCANNING VLSI IMPLEMENTATION

被引:3
作者
MERTENS, JD
BHEND, WL
机构
[1] GE Medical Systems, Milwaukee, WI, 53201, P.O. Box 414
关键词
D O I
10.1109/23.273447
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have implemented a modular digital coincidence detection circuit in VLSI, which drastically reduces the size, and increases the performance of the coincidence detection logic required in a PET scanner. Important acquisition features contained within this integrated solution include: (1) Prompt and delayed processing channels for each event-pair, with programmable coincidence time windows; (2) Event time difference mode, which allows for a fast and accurate system timing calibration algorithm; (3) Programmable axial event acceptance, which provides acquisition flexibility from conventional 2D through fully-3D sinogram sets and (4) Programmable transaxial field of view, which provides an 'electronic' collimator to ignore event-pairs outside of the desired field of view. The modularity of the design allows it to be used on various system geometries.
引用
收藏
页码:2037 / 2039
页数:3
相关论文
共 2 条
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