ADAPTIVE SEQUENTIAL TESTING FOR EDUCATIONAL-EVALUATION

被引:1
作者
KOBAYASHI, O
机构
[1] Sanno Junior College, Tokyo
来源
ELECTRONICS AND COMMUNICATIONS IN JAPAN PART III-FUNDAMENTAL ELECTRONIC SCIENCE | 1994年 / 77卷 / 07期
关键词
EDUCATIONAL ASSESSMENT; EDUCATIONAL INFORMATION; CAT; JAPANESE EDUCATION; ADAPTIVE TESTING;
D O I
10.1002/ecjc.4430770701
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes the adaptive sequential testing method as one means of proficiency testing, The proficiency test in general has the following problems: 1) the test contains a large number of items which are far from the educational level of the subject and deprives the subject of the motivation for the test; and 2) to secure the accuracy of the test result, the number of items is increased, which burdens the subject. To solve these problems, a system is considered in which test items for which correct/incorrect decision can be made immediately are pooled and the items are selected by a computer to be presented to the subject. As the method of testing, the adaptive sequential testing is extended to the case of multiple hypothesis and the adaptive selection is proposed for the selection of the test items. In the proposed testing system, only the correct answer ratio for each educational level is attached to the pooled test items, By a trial simulation, the number of posed problems is halved and the system is verified to be a practical testing method with less burden to the subject.
引用
收藏
页码:1 / 12
页数:12
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