CRYSTAL-STRUCTURE OF V2P

被引：12

作者：

BERGER, R ^{[1
]}

TERGENIUS, LE ^{[1
]}

机构：

[1] UNIV UPPSALA,INST CHEM,S-75121 UPPSALA,SWEDEN

来源：

ACTA CHEMICA SCANDINAVICA SERIES A-PHYSICAL AND INORGANIC CHEMISTRY | 1976年 / 30卷 / 05期

关键词：

D O I：

10.3891/acta.chem.scand.30a-0387

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

引用

页码：387 / 389

页数：3

共 13 条

[1] THE PHOTOMETRIC DETERMINATION OF SMALL AMOUNTS OF SILICON IN NICKEL AND NICKEL ALLOYS USED IN ELECTRONIC DEVICES [J].

ANDREW, TR .

ANALYST, 1957, 82 (975) :423-427

[2] V-P, V-AS AND CR-AS SYSTEMS [J].

BERGER, R .

ACTA CHEMICA SCANDINAVICA SERIES A-PHYSICAL AND INORGANIC CHEMISTRY, 1975, 29 (06) :641-642

[3] X-RAY INVESTIGATION IN TERNARY-SYSTEM V - P - C [J].

BOLLER, H .

MONATSHEFTE FUR CHEMIE, 1973, 104 (01) :48-56

[4] ANOMALOUS DISPERSION CORRECTIONS COMPUTED FROM SELF-CONSISTENT FIELD RELATIVISTIC DIRAC-SLATER WAVE FUNCTIONS [J].

CROMER, DT .

ACTA CRYSTALLOGRAPHICA, 1965, 18 :17-&

[5] X-RAY TO VISIBLE WAVELENGTH RATIOS [J].

DESLATTES, RD ;

HENINS, A .

PHYSICAL REVIEW LETTERS, 1973, 31 (16) :972-975

[6]

GUSTAFSSON L, COMMUNICATION

[7] HFS ATOMIC SCATTERING FACTORS [J].

HANSON, HP ;

SKILLMAN, S ;

HERMAN, F ;

LEA, JD .

ACTA CRYSTALLOGRAPHICA, 1964, 17 (08) :1040-&

[8] TREATING WEAK REFLECTIONS IN LEAST-SQUARES CALCULATIONS [J].

HIRSHFELD, FL ;

RABINOVI.D .

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1973, A 29 (SEP1) :510-513

[9]

LUNDGREN JO, 1975, UUICB13042 U UPPS I

[10] CRYSTAL STRUCTURE OF RE2P [J].

RUNDQVIST, S .

ACTA CHEMICA SCANDINAVICA, 1961, 15 (02) :342-&

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