2-PHOTON SPECTROSCOPY OF THE A2-SIGMA+-X2-PI-I SYSTEM OF OH

被引:25
|
作者
CROSLEY, DR
SMITH, GP
机构
来源
JOURNAL OF CHEMICAL PHYSICS | 1983年 / 79卷 / 10期
关键词
D O I
10.1063/1.445620
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:4764 / 4773
页数:10
相关论文
共 50 条
  • [41] 2-COLOR, 2-PHOTON EXCITATION OF THE NO(A2-SIGMA+) STATE
    LAHMANI, F
    LARDEUX, C
    SOLGADI, D
    ZEHNACKER, A
    DIMICOLI, I
    BOIVINEAU, M
    MONS, M
    PIUZZI, F
    JOURNAL OF PHYSICAL CHEMISTRY, 1985, 89 (26): : 5646 - 5649
  • [42] 2-PHOTON EXCITATION OF NO2 - SPECTROSCOPY AND DYNAMICS
    TAPPER, RS
    BIGIO, L
    GRANT, ER
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1983, 186 (AUG): : 104 - PHYS
  • [43] 2-PHOTON OPTICAL SPECTROSCOPY IN HGII
    BERGQUIST, JC
    WINELAND, DJ
    ITANO, WM
    HEMMATI, H
    DANIEL, HU
    LEUCHS, G
    IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1986, 33 (01) : 118 - 118
  • [44] 2-PHOTON MOLECULAR-SPECTROSCOPY
    FRIEDRICH, DM
    JOURNAL OF CHEMICAL EDUCATION, 1982, 59 (06) : 472 - 481
  • [45] 2-PHOTON EXCITED FLUORESCENCE SPECTROSCOPY
    CHEN, KM
    YEUNG, ES
    JOURNAL OF CHEMICAL PHYSICS, 1979, 70 (03): : 1312 - 1319
  • [46] 2-PHOTON SPECTROSCOPY OF BENZENE GAS
    WUNSCH, L
    NEUSSER, HJ
    SCHLAG, EW
    BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1976, 80 (11): : 1239 - 1239
  • [47] 2-PHOTON OPTICAL IMPEDANCE SPECTROSCOPY
    BOBULESCU, RC
    STANCIULESCU, C
    SURMEIAN, A
    POPESCU, D
    POPESCU, II
    COLLINS, CB
    REVUE ROUMAINE DE PHYSIQUE, 1980, 25 (08): : 927 - 933
  • [48] 2-PHOTON ABSORPTION SPECTROSCOPY IN YTTERBIUM
    CAMUS, P
    DEBARRE, A
    MORILLON, C
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1978, 11 (13) : L395 - L396
  • [49] SUBNATURAL LINEWIDTH 2-PHOTON SPECTROSCOPY
    HUANG, Y
    CHINESE PHYSICS, 1983, 3 (03): : 708 - 712
  • [50] 2-PHOTON SPECTROSCOPY OF RYDBERG STATES OF NO
    PRATT, ST
    JUNGEN, C
    MIESCHER, E
    JOURNAL OF CHEMICAL PHYSICS, 1989, 90 (11): : 5971 - 5981