INVESTIGATION OF THE INITIAL-STAGES OF OXIDATION OF MICROCRYSTALLINE SILICON BY MEANS OF X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：19

作者：

GIMZEWSKI, JK ^{[1
]}

VEPREK, S ^{[1
]}

机构：

[1] UNIV ZURICH,INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND

来源：

SOLID STATE COMMUNICATIONS | 1983年 / 47卷 / 09期

关键词：

D O I：

10.1016/0038-1098(83)90648-8

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：747 / 751

页数：5

共 30 条

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