APPLICATIONS OF THE RAMAN MICROPROBE IN SEMICONDUCTOR-DEVICE MANUFACTURING

被引:0
作者
NEEDHAM, CD
机构
来源
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 1983年 / 411卷
关键词
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:13 / 17
页数:5
相关论文
共 8 条
[1]   MEASUREMENT OF THE CRYSTALLOGRAPHICALLY TRANSFORMED ZONE PRODUCED BY FRACTURE IN CERAMICS CONTAINING TETRAGONAL ZIRCONIA [J].
CLARKE, DR ;
ADAR, F .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1982, 65 (06) :284-288
[2]  
CUNNINGHAM WC, 1979, MICROBEAM ANAL, P149
[3]   ANALYSIS OF FLUID INCLUSIONS WITH THE MOLE RAMAN MICROPROBE [J].
DHAMELINCOURT, P ;
BENY, JM ;
DUBESSY, J ;
POTY, B .
BULLETIN DE MINERALOGIE, 1979, 102 (5-6) :600-610
[4]  
ETZ ES, 1979, NBS SPECIAL PUBLICAT, V519, P723
[5]  
ETZ ES, 1979, SCANNING ELECTRON MI, V1, P67
[6]  
ETZ ES, 1979, MICROBEAM ANAL, P173
[7]   STUDY OF CO(OR NI)-MO OXIDE PHASE-TRANSFORMATION AND HYDRODESULFURIZATION CATALYSTS BY RAMAN MICRO-PROBE EQUIPPED WITH NEW CELLS [J].
PAYEN, E ;
DHAMELINCOURT, MC ;
DHAMELINCOURT, P ;
GRIMBLOT, J ;
BONNELLE, JP .
APPLIED SPECTROSCOPY, 1982, 36 (01) :30-37
[8]  
1980, ACTUALITE CHIMIQ APR