THE REDUCTION OF RADIATION-DAMAGE IN THE ELECTRON-MICROSCOPE

被引：36
作者：
FRYER, JR
HOLLAND, F
机构：
来源：
ULTRAMICROSCOPY | 1983年 / 11卷 / 01期
关键词：
D O I：
10.1016/0304-3991(83)90055-4
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：67 / 70
页数：4
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