OXYGEN OUTGASSING CAUSED BY ELECTRON BOMBARDMENT OF GLASS

被引：199

作者：

LINEWEAVER, JL

机构：

来源：

关键词：

D O I：

10.1063/1.1702680

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1786 / &

共 8 条

[1] HELIUM DIFFUSION THROUGH GLASS [J].

ALTEMOSE, VO .

[2] BACK SCATTERING OF ELECTRONS [J].

ARCHARD, GD .

[3] ENERGY DISSIPATION AND SECONDARY ELECTRON EMISSION IN SOLIDS [J].

KANTER, H .

PHYSICAL REVIEW, 1961, 121 (03) :677-&

[4] ELECTRON BOMBARDMENT EFFECTS IN THIN DIELECTRIC LAYERS [J].

SPEAR, WE .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1955, 68 (12) :991-1000

[5] OUTGASSING CAUSED BY ELECTRON BOMBARDMENT OF GLASS [J].

TODD, BJ ;

LINEWEAVER, JL ;

KERR, JT .

[6] X-ray determination of the structure of liquids and glass [J].

Warren, BE .

[7] PENETRATION OF ELECTRONS IN ALUMINUM OXIDE FILMS [J].

YOUNG, JR .

PHYSICAL REVIEW, 1956, 103 (02) :292-293

[8] The atomic arrangement in glass [J].

Zachariasen, WH .