共 35 条
ANNEALING OF SELENIUM-IMPLANTED GAAS
被引:17
作者:

BARRETT, NJ
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND

GRANGE, JD
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UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND

SEALY, BJ
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UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND

STEPHENS, KG
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UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
机构:
[1] UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
关键词:
D O I:
10.1063/1.333916
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
引用
收藏
页码:3503 / 3507
页数:5
相关论文
共 35 条
[1]
APPLICATION OF THERMAL PULSE ANNEALING TO ION-IMPLANTED GAALAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS
[J].
ASBECK, PM
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ASBECK, PM
论文数: 0 引用数: 0
h-index: 0

MILLER, DL
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h-index: 0

BABCOCK, EJ
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h-index: 0

KIRKPATRICK, CG
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ELECTRON-BEAM ANNEALING OF ZINC IMPLANTED GAAS TO CONTROL PROFILE BROADENING
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1984, 20 (04)
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BARRETT, NJ
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机构:
UNIV SURREY, DEPT ELECTR & ELECT ENGN, GUILDFORD GU2 5XH, SURREY, ENGLAND UNIV SURREY, DEPT ELECTR & ELECT ENGN, GUILDFORD GU2 5XH, SURREY, ENGLAND

SEALY, BJ
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV SURREY, DEPT ELECTR & ELECT ENGN, GUILDFORD GU2 5XH, SURREY, ENGLAND UNIV SURREY, DEPT ELECTR & ELECT ENGN, GUILDFORD GU2 5XH, SURREY, ENGLAND
[3]
AIN CAPPED ANNEALING OF SE AND SN IMPLANTED SEMI-INSULATING GAAS
[J].
BENSALEM, R
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BARRETT, NJ
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SEALY, BJ
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ELECTRONICS LETTERS,
1983, 19 (03)
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BENSALEM, R
论文数: 0 引用数: 0
h-index: 0

BARRETT, NJ
论文数: 0 引用数: 0
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SEALY, BJ
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[4]
DAMAGE ANNEALING BEHAVIOR OF SE IMPLANTED GAAS
[J].
BHATTACHARYA, RS
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RAI, AK
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PRONOKO, PP
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JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1983, 44 (01)
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BHATTACHARYA, RS
论文数: 0 引用数: 0
h-index: 0
机构: OAK RIDGE NATL LAB,DIV SOLID STATE,OAK RIDGE,TN 37830

RAI, AK
论文数: 0 引用数: 0
h-index: 0
机构: OAK RIDGE NATL LAB,DIV SOLID STATE,OAK RIDGE,TN 37830

PRONOKO, PP
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h-index: 0
机构: OAK RIDGE NATL LAB,DIV SOLID STATE,OAK RIDGE,TN 37830

NARAYAN, J
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h-index: 0
机构: OAK RIDGE NATL LAB,DIV SOLID STATE,OAK RIDGE,TN 37830

LING, SC
论文数: 0 引用数: 0
h-index: 0
机构: OAK RIDGE NATL LAB,DIV SOLID STATE,OAK RIDGE,TN 37830

WILSON, SR
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h-index: 0
机构: OAK RIDGE NATL LAB,DIV SOLID STATE,OAK RIDGE,TN 37830
[5]
FLUENCE DEPENDENCE OF DISPLACEMENT DAMAGE, RESIDUAL DEFECTS, AND ELECTRICAL-PROPERTIES OF HIGH-TEMPERATURE-ANNEALED SE-+-IMPLANTED GAAS
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BHATTACHARYA, RS
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JOURNAL OF APPLIED PHYSICS,
1982, 53 (07)
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BHATTACHARYA, RS
论文数: 0 引用数: 0
h-index: 0
机构: USAF,WRIGHT AERONAUT LABS,AVION LAB,WRIGHT PATTERSON AFB,OH 45433

PRONKO, PP
论文数: 0 引用数: 0
h-index: 0
机构: USAF,WRIGHT AERONAUT LABS,AVION LAB,WRIGHT PATTERSON AFB,OH 45433

YEO, YK
论文数: 0 引用数: 0
h-index: 0
机构: USAF,WRIGHT AERONAUT LABS,AVION LAB,WRIGHT PATTERSON AFB,OH 45433

RAI, AK
论文数: 0 引用数: 0
h-index: 0
机构: USAF,WRIGHT AERONAUT LABS,AVION LAB,WRIGHT PATTERSON AFB,OH 45433

PARK, YS
论文数: 0 引用数: 0
h-index: 0
机构: USAF,WRIGHT AERONAUT LABS,AVION LAB,WRIGHT PATTERSON AFB,OH 45433

NARAYAN, J
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h-index: 0
机构: USAF,WRIGHT AERONAUT LABS,AVION LAB,WRIGHT PATTERSON AFB,OH 45433
[6]
THERMAL EXPANSION OF SPUTTERED SILICON NITRIDE FILMS
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BURKHARDT, PJ
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JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969, 116 (06)
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BURKHARDT, PJ
论文数: 0 引用数: 0
h-index: 0
机构: IBM Components Division, East Fishkill Laboratory, Hopewell Junction, New York

MARVEL, RF
论文数: 0 引用数: 0
h-index: 0
机构: IBM Components Division, East Fishkill Laboratory, Hopewell Junction, New York
[7]
TRANSIENT ANNEALING OF SELENIUM-IMPLANTED GALLIUM-ARSENIDE USING A GRAPHITE STRIP HEATER
[J].
CHAPMAN, RL
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DONNELLY, JP
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TSAUR, BY
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APPLIED PHYSICS LETTERS,
1982, 40 (09)
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CHAPMAN, RL
论文数: 0 引用数: 0
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FAN, JCC
论文数: 0 引用数: 0
h-index: 0

DONNELLY, JP
论文数: 0 引用数: 0
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TSAUR, BY
论文数: 0 引用数: 0
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[8]
SILICON-ION-IMPLANTED AND SELENIUM-ION-IMPLANTED GAAS REPRODUCIBLY ANNEALED AT TEMPERATURES UP TO 950DEGREESC
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APPLIED PHYSICS LETTERS,
1975, 27 (01)
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DONNELLY, JP
论文数: 0 引用数: 0
h-index: 0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173 MIT,LINCOLN LAB,LEXINGTON,MA 02173

LINDLEY, WT
论文数: 0 引用数: 0
h-index: 0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173 MIT,LINCOLN LAB,LEXINGTON,MA 02173

HURWITZ, CE
论文数: 0 引用数: 0
h-index: 0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173 MIT,LINCOLN LAB,LEXINGTON,MA 02173
[9]
EVAPORATION OF GAAS UNDER EQUILIBRIUM AND NONEQUILIBRIUM CONDITIONS USING A MODULATED BEAM TECHNIQUE
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FOXON, CT
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FOXON, CT
论文数: 0 引用数: 0
h-index: 0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND MULLARD RES LABS,REDHILL,SURREY,ENGLAND

HARVEY, JA
论文数: 0 引用数: 0
h-index: 0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND MULLARD RES LABS,REDHILL,SURREY,ENGLAND

JOYCE, BA
论文数: 0 引用数: 0
h-index: 0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND MULLARD RES LABS,REDHILL,SURREY,ENGLAND
[10]
EFFICIENT DOPING OF GAAS BY SE+ ION IMPLANTATION
[J].
FOYT, AG
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DONNELLY, JP
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LINDLEY, WT
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APPLIED PHYSICS LETTERS,
1969, 14 (12)
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FOYT, AG
论文数: 0 引用数: 0
h-index: 0
机构: Lincoln Laboratory, Massachusetts Institute of Technology, Lexington

DONNELLY, JP
论文数: 0 引用数: 0
h-index: 0
机构: Lincoln Laboratory, Massachusetts Institute of Technology, Lexington

LINDLEY, WT
论文数: 0 引用数: 0
h-index: 0
机构: Lincoln Laboratory, Massachusetts Institute of Technology, Lexington