PRECISION SURFACE METROLOGY

被引：1
作者：
WYANT, JC
机构：
来源：
OPTICAL ENGINEERING | 1984年 / 23卷 / 04期
关键词：
D O I：
10.1117/12.7973297
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：349 / 349
页数：1
相关论文
共 50 条
  • [41] Precision Metrology at the University of Western Australia
    Tobar, Michael E.
    Ivanov, Eugene N.
    Creedon, Daniel L.
    le Floch, Jean-Michel
    Benmessai, Karim
    Fan, Yaohui
    Farr, Warrick
    Reshitnyk, Yarema
    Duty, Timothy L.
    Martinis, John M.
    ASIA-PACIFIC MICROWAVE CONFERENCE 2011, 2011, : 586 - 589
  • [42] Erratum to “Precision interferometric surface metrology of transparent thin film using wavelength tuning”
    Yangjin Kim
    Journal of Mechanical Science and Technology, 2018, 32 : 3487 - 3487
  • [43] Axion detection with precision frequency metrology
    Goryachev, Maxim
    McAllister, Ben T.
    Tobar, Michael E.
    PHYSICS OF THE DARK UNIVERSE, 2019, 26
  • [44] Application of Algorithms for High Precision Metrology
    Gai, M.
    Riva, A.
    Busonero, D.
    Buzzi, R.
    Russo, F.
    PUBLICATIONS OF THE ASTRONOMICAL SOCIETY OF THE PACIFIC, 2013, 125 (933) : 1383 - 1392
  • [45] A PRECISION GAS FLOWMETER FOR VACUUM METROLOGY
    JOUSTEN, K
    MESSER, G
    WANDREY, D
    VACUUM, 1993, 44 (02) : 135 - 141
  • [46] Development of a precision dual level stage system for the dimensional metrology of large range surface topography
    Kim, Jon-Ahn
    Kim, Jae Wan
    Eom, Tae Bong
    Kang, Chu-Shik
    ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES III, 2007, 6672
  • [47] SURFACE METROLOGY INSTRUMENTATION
    WHITEHOUSE, DJ
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1987, 20 (10): : 1145 - 1155
  • [48] SURFACE METROLOGY FORUM
    不详
    INDUSTRIAL LUBRICATION AND TRIBOLOGY, 1994, 46 (01) : 32 - 34
  • [49] Problems in surface metrology
    Natl Inst of Standards and, Technology, Gaithersburg, United States
    Int J Mach Tools Manuf, 5-6 (417-418):
  • [50] SURFACE METROLOGY SEMINAR
    不详
    MECHANICAL ENGINEERING, 2009, 131 (04) : 11 - 11
12345