CYLINDRICAL-MIRROR ANALYZER INCORPORATING PRE-RETARDATION

被引：1

作者：

BAKER, JH ^{[1
]}

WILLIAMS, EM ^{[1
]}

机构：

[1] UNIV LIVERPOOL,DEPT ELECT ENGN & ELECTR,POB 147,LIVERPOOL L69 3BX,ENGLAND

来源：

VACUUM | 1975年 / 25卷 / 08期

关键词：

D O I：

10.1016/0042-207X(75)91655-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：373 / 376

页数：4

共 23 条

[1] STUDY OF ELECTRON OPTICAL PROPERTIES OF AN ELECTRON SPECTROGRAPH WITH COAXIAL CYLINDRICAL ELECTRODES [J].

AKSELA, S ;

KARRAS, M ;

PESSA, M ;

SUONINEN, E .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (03) :351-&

[2] ADSORPTION OF OXYGEN AT TUNGSTEN SINGLE-CRYSTAL - (110) FACE [J].

ASHCROFT, KW ;

LECK, JH ;

WILLIAMS, EM .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1974, 7 (11) :1965-1973

[3] APPARATUS FOR STUDY OF ELECTRON STIMULATED DESORPTION OF IONS FROM SURFACES [J].

ASHCROFT, KW ;

SANDSTROM, DR ;

STIMPSON, BP ;

WILLIAMS, EM ;

LECK, JH .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (11) :1106-+

[4] HIGH-TEMPERATURE AUGER-ELECTRON SPECTROSCOPY [J].

BAS, EB ;

BANNINGER, U .

SURFACE SCIENCE, 1974, 41 (01) :1-10

[5] HIGH-ENERGY RESOLUTION AUGER-ELECTRON SPECTROMETER USING CONCENTRIC HEMISPHERES [J].

BASSETT, PJ ;

GALLON, TE ;

PRUTTON, M .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (10) :1008-&

[6]

Bishop H. E., 1973, Journal of Electron Spectroscopy and Related Phenomena, V1, P389, DOI 10.1016/0368-2048(72)80040-9

[7] RETARDING-FIELD-CYLINDRICAL-MIRROR ANALYZER [J].

GERLACH, RL .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01) :122-125

[8] COMPARISON OF SPHERICAL DEFLECTOR AND CYLINDRICAL MIRROR ANALYZERS [J].

HAFNER, H ;

SIMPSON, JA ;

KUYATT, CE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (01) :33-&

[9]

HASS TW, 1970, PHYS REV B, V1, P1449

[10] COMPARISON OF ETENDUE OF ELECTRON SPECTROMETERS [J].

HEDDLE, DWO .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (08) :589-&

← 1 2 3 →