A SCANNING TOTAL REFLECTION METHOD FOR REFRACTIVE-INDEX PROFILING

被引：2

|

作者：

ZHU, XF

IGA, K

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1989年 / 28卷 / 08期

关键词：

D O I：

10.1143/JJAP.28.1497

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1497 / 1500

页数：4

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