A SCANNING TOTAL REFLECTION METHOD FOR REFRACTIVE-INDEX PROFILING

被引：2
|
作者：
ZHU, XF
IGA, K
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1989年 / 28卷 / 08期
关键词：
D O I：
10.1143/JJAP.28.1497
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1497 / 1500
页数：4
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