DYNAMIC-MODEL OF TRAPPING-DETRAPPING IN SIO2

被引：102

作者：

NISSANCOHEN, Y ^{[1
]}

SHAPPIR, J ^{[1
]}

FROHMANBENTCHKOWSKY, D ^{[1
]}

机构：

[1] HEBREW UNIV JERUSALEM,SCH APPL SCI & TECHNOL,DIV APPL PHYS,JERUSALEM,ISRAEL

来源：

JOURNAL OF APPLIED PHYSICS | 1985年 / 58卷 / 06期

关键词：

D O I：

10.1063/1.335942

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2252 / 2261

页数：10

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