MEASUREMENT OF THE PRINCIPAL REFRACTIVE-INDEXES OF THIN-FILMS DEPOSITED AT OBLIQUE-INCIDENCE

被引：48

作者：

HODGKINSON, IJ

HOROWITZ, F

MACLEOD, HA

SIKKENS, M

WHARTON, JJ

机构：

[1] UNIV FED RIO GRANDE SUL,INST FIS,BR-90000 PORTO ALEGRE,RS,BRAZIL

[2] UNIV GRONINGEN,DEPT APPL PHYS,9747 A6 GRONINGEN,NETHERLANDS

[3] USAF,WRIGHT AERONAUT LABS,AIR FORCE INST TECHNOL,ENP,WRIGHT PATTERSON AFB,OH 45433

[4] UNIV ARIZONA,CTR OPT SCI,TUCSON,AZ 85721

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1985年 / 2卷 / 10期

关键词：

D O I：

10.1364/JOSAA.2.001693

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1693 / 1697

页数：5

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