ANALYSIS OF SEMITRANSPARENT LAYERED MATERIALS BY MODULATED PHOTOTHERMAL RADIOMETRY - APPLICATION TO THE BONDING AND THICKNESS CONTROL OF ENAMEL COATINGS

被引：10
|
作者：
EGEE, M [1 ]
DARTOIS, R [1 ]
MARX, J [1 ]
BISSIEUX, C [1 ]
机构：
[1] FAC SCI REIMS,RECH OPT LAB,F-51062 REIMS,FRANCE
来源：
CANADIAN JOURNAL OF PHYSICS | 1986年 / 64卷 / 09期
关键词：
D O I：
10.1139/p86-226
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1297 / 1302
页数：6
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