DEPTH-PROFILING OF CU-NI SANDWICH SAMPLES BY SECONDARY ION MASS-SPECTROMETRY

被引：82

作者：

HOFER, WO ^{[1
]}

LIEBL, H ^{[1
]}

机构：

[1] EURATOM,MAX PLANCK INST PLASMA PHYS,D-8046 GARCHING,FED REP GER

来源：

APPLIED PHYSICS | 1975年 / 8卷 / 04期

关键词：

D O I：

10.1007/BF00898370

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：359 / 360

页数：2

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Hermanne N., 1973, Radiation Effects, V19, P161, DOI 10.1080/00337577308232237

[8]

HOFER WO, TO BE PUBLISHED

[9]

LIEBL H, 1971, INT J MASS SPECTROM, V6, P407

[10] MECHANISM OF SURFACE MICRO-ROUGHENING BY ION-BOMBARDMENT [J].

SIGMUND, P .