INTENSITY NOISE AND POLARIZATION STABILITY OF GAALAS-GAAS SURFACE EMITTING LASERS

被引：58
作者：
KOYAMA, F [1 ]
MORITO, K [1 ]
IGA, K [1 ]
机构：
[1] FUJITSU LABS LTD,ATSUGI 24301,JAPAN
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 1991年 / 27卷 / 06期
关键词：
D O I：
10.1109/3.89958
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The intensity noise characteristics of GaAlAs-GaAs vertical cavity surface emitting (SE) lasers have been investigated. A low intensity noise of -145 dB/Hz was obtained with an output power of 2.2 mW. The spontaneous emission factor is estimated to be 2 x 10(-5), both from the bias dependence of the intensity noise and from the relative mode intensity below threshold. This is in good agreement with theoretical expectation. We show the possibility of low noise operation of a micro-cavity SE laser with an extremely low output power of less than approximately 100-mu-W. In addition, the polarization stability of the surface emitting laser is discussed by measuring the intensity fluctuations of an individual polarization state.
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收藏
页码：1410 / 1416
页数：7
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