RAPID-THERMAL-OXIDIZED POROUS SI - THE SUPERIOR PHOTOLUMINESCENT SI

被引:381
作者
PETROVAKOCH, V [1 ]
MUSCHIK, T [1 ]
KUX, A [1 ]
MEYER, BK [1 ]
KOCH, F [1 ]
LEHMANN, V [1 ]
机构
[1] SIEMENS RES LABS,W-8000 MUNICH,GERMANY
关键词
D O I
10.1063/1.107736
中图分类号
O59 [应用物理学];
学科分类号
摘要
To improve the stability of porous Si (PS) prepared by electrochemical etching, we make use of rapid-thermal oxidation (RTO). During RTO processing, the hydride coverage of the internal surfaces of the pores is replaced by a high-quality oxide while retaining nm-sized Si grains. With increasing process temperature T(ox) the luminescence is first quenched. It is recovered with comparable intensity for T(ox) greater-than-or-equal-to 700-degrees-C.
引用
收藏
页码:943 / 945
页数:3
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