首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
ISOTOPIC TRACER STUDIES OF OXYGEN-TRANSPORT THROUGH SIO2-FILMS AT 1000-DEGREES-C USING SECONDARY ION MASS-SPECTROMETRY
被引:29
作者
:
HAN, CJ
论文数:
0
引用数:
0
h-index:
0
HAN, CJ
HELMS, CR
论文数:
0
引用数:
0
h-index:
0
HELMS, CR
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1986年
/ 59卷
/ 05期
关键词
:
D O I
:
10.1063/1.337028
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1767 / 1769
页数:3
相关论文
共 8 条
[1]
ISOTOPE LABELING STUDIES OF THE OXIDATION OF SILICON AT 1000-DEGREES-C AND 1300-DEGREES-C
COSTELLO, JA
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV, DEPT MAT SCI & ENGN, UNIVERSITY PK, PA 16802 USA
PENN STATE UNIV, DEPT MAT SCI & ENGN, UNIVERSITY PK, PA 16802 USA
COSTELLO, JA
TRESSLER, RE
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV, DEPT MAT SCI & ENGN, UNIVERSITY PK, PA 16802 USA
PENN STATE UNIV, DEPT MAT SCI & ENGN, UNIVERSITY PK, PA 16802 USA
TRESSLER, RE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(08)
: 1944
-
1947
[2]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[3]
HAN CW, UNPUB
[4]
MIKKELSEN JC, 1984, APPL PHYS LETT, V45, P1187, DOI 10.1063/1.95086
[5]
AN O-18 STUDY OF THE OXIDATION MECHANISM OF SILICON IN DRY OXYGEN
ROCHET, F
论文数:
0
引用数:
0
h-index:
0
ROCHET, F
AGIUS, B
论文数:
0
引用数:
0
h-index:
0
AGIUS, B
RIGO, S
论文数:
0
引用数:
0
h-index:
0
RIGO, S
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(04)
: 914
-
923
[6]
O-18 STUDY OF THE THERMAL-OXIDATION OF SILICON IN OXYGEN
ROSENCHER, E
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ROSENCHER, E
STRABONI, A
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
STRABONI, A
RIGO, S
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
RIGO, S
AMSEL, G
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
AMSEL, G
[J].
APPLIED PHYSICS LETTERS,
1979,
34
(04)
: 254
-
256
[7]
ROUSE JW, 1982, COMPUT AIDED DESIGN, P261
[8]
NEW WIDE ANGLE, HIGH TRANSMISSION ENERGY ANALYZER FOR SECONDARY ION MASS-SPECTROMETRY
SIEGEL, MW
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SIEGEL, MW
VASILE, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
VASILE, MJ
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1981,
52
(11)
: 1603
-
1615
←
1
→
共 8 条
[1]
ISOTOPE LABELING STUDIES OF THE OXIDATION OF SILICON AT 1000-DEGREES-C AND 1300-DEGREES-C
COSTELLO, JA
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV, DEPT MAT SCI & ENGN, UNIVERSITY PK, PA 16802 USA
PENN STATE UNIV, DEPT MAT SCI & ENGN, UNIVERSITY PK, PA 16802 USA
COSTELLO, JA
TRESSLER, RE
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV, DEPT MAT SCI & ENGN, UNIVERSITY PK, PA 16802 USA
PENN STATE UNIV, DEPT MAT SCI & ENGN, UNIVERSITY PK, PA 16802 USA
TRESSLER, RE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(08)
: 1944
-
1947
[2]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[3]
HAN CW, UNPUB
[4]
MIKKELSEN JC, 1984, APPL PHYS LETT, V45, P1187, DOI 10.1063/1.95086
[5]
AN O-18 STUDY OF THE OXIDATION MECHANISM OF SILICON IN DRY OXYGEN
ROCHET, F
论文数:
0
引用数:
0
h-index:
0
ROCHET, F
AGIUS, B
论文数:
0
引用数:
0
h-index:
0
AGIUS, B
RIGO, S
论文数:
0
引用数:
0
h-index:
0
RIGO, S
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(04)
: 914
-
923
[6]
O-18 STUDY OF THE THERMAL-OXIDATION OF SILICON IN OXYGEN
ROSENCHER, E
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ROSENCHER, E
STRABONI, A
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
STRABONI, A
RIGO, S
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
RIGO, S
AMSEL, G
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
ECOLE NORM SUPER,GROUPE PHYS SOLIDES,F-75221 PARIS 05,FRANCE
AMSEL, G
[J].
APPLIED PHYSICS LETTERS,
1979,
34
(04)
: 254
-
256
[7]
ROUSE JW, 1982, COMPUT AIDED DESIGN, P261
[8]
NEW WIDE ANGLE, HIGH TRANSMISSION ENERGY ANALYZER FOR SECONDARY ION MASS-SPECTROMETRY
SIEGEL, MW
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SIEGEL, MW
VASILE, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
VASILE, MJ
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1981,
52
(11)
: 1603
-
1615
←
1
→