IMPORTANCE OF TEMPERATURE-DEPENDENT OPTICAL-PROPERTIES FOR RAMAN TEMPERATURE-MEASUREMENTS FOR SILICON

被引:31
作者
JELLISON, GE
LOWNDES, DH
WOOD, RF
机构
来源
PHYSICAL REVIEW B | 1983年 / 28卷 / 06期
关键词
D O I
10.1103/PhysRevB.28.3272
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:3272 / 3276
页数:5
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