PHOTOCURRENT DEEP LEVEL TRANSIENT SPECTROSCOPY IN SILICON

被引:19
作者
BROTHERTON, SD
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10.1063/1.332913
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O59 [应用物理学];
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页码:3636 / 3643
页数:8
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共 12 条
[1]   OPTICAL-PROPERTIES OF GOLD ACCEPTOR AND DONOR LEVELS IN SILICON [J].
BRAUN, S ;
GRIMMEISS, HG .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (06) :2658-2665
[2]   MEASUREMENT OF MINORITY-CARRIER CAPTURE CROSS-SECTIONS AND APPLICATION TO GOLD AND PLATINUM IN SILICON [J].
BROTHERTON, SD ;
BRADLEY, P .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) :1543-1553
[3]   THE WIDTH OF THE NON-STEADY STATE TRANSITION REGION IN DEEP LEVEL IMPURITY MEASUREMENTS [J].
BROTHERTON, SD .
SOLID-STATE ELECTRONICS, 1983, 26 (10) :987-990
[4]   ELECTRON-CAPTURE CROSS-SECTION AND ENERGY-LEVEL OF GOLD ACCEPTOR CENTER IN SILICON [J].
BROTHERTON, SD ;
BICKNELL, J .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (02) :667-671
[5]   ELECTRON AND HOLE CAPTURE AT AU AND PT CENTERS IN SILICON [J].
BROTHERTON, SD ;
LOWTHER, JE .
PHYSICAL REVIEW LETTERS, 1980, 44 (09) :606-609
[6]   DEEP-STATE-CONTROLLED MINORITY-CARRIER LIFETIME IN N-TYPE GALLIUM-PHOSPHIDE [J].
HAMILTON, B ;
PEAKER, AR ;
WIGHT, DR .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (10) :6373-6385
[7]   SWITCHING TIME IN JUNCTION DIODES AND JUNCTION TRANSISTORS [J].
KINGSTON, RH .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1954, 42 (05) :829-834
[8]   DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J].
LANG, DV .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) :3023-3032
[9]  
MITONNEAU A, 1977, I PHYS C SER A, V33, P73
[10]  
SZE SM, 1969, PHYSICS SEMICONDUCTO, P661