AU(PT)PD OHMIC CONTACTS TO P-ZNTE

被引:46
作者
OZAWA, M
HIEI, F
ISHIBASHI, A
AKIMOTO, K
机构
[1] SONY Corporation Research Center, Yokohama 240
关键词
OHMIC CONTACTS; II-VI SEMICONDUCTORS;
D O I
10.1049/el:19930337
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Au(Pt)Pd ohmic contacts to p-ZnTe are reported, with a determination of the optimum annealing temperature and the optimum Pd layer thickness. The specific contact resistance, measured by the transmission line method, was as low as 5 x 10(-6) OMEGA cm-2. This value of the specific contact resistance is two orders of magnitude lower than that of Au or Au/Pt contact to p-ZnTe.
引用
收藏
页码:503 / 505
页数:3
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