MEASUREMENT OF GAMMA RAY INDUCED SECONDARY ELECTRON CURRENT FROM VARIOUS ELEMENTS

被引：26
作者：
EBERT, PJ
LAUZON, AF
机构：
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1966年 / NS13卷 / 01期
关键词：
D O I：
10.1109/TNS.1966.4324039
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：735 / +
页数：1
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