NITROGEN-IMPLANTED SILICON .1. DAMAGE ANNEALING AND LATTICE LOCATION

被引:47
作者
MITCHELL, JB
PRONKO, PP
SHEWCHUN, J
THOMPSON, DA
DAVIES, JA
机构
[1] MCMASTER UNIV,DEPT ENGN PHYS,HAMILTON,ONTARIO,CANADA
[2] ATOM ENERGY CANADA LTD,CHALK RIVER NUCL LABS,SOLID STATE SCI BRANCH,CHALK RIVER,ONTARIO,CANADA
关键词
D O I
10.1063/1.321339
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:332 / 334
页数:3
相关论文
共 9 条
[1]  
DEXTER RJ, 1973, APPL PHYS LETT, V23, P45
[2]   FURTHER INVESTIGATION OF N15+P REACTIONS [J].
HAGEDORN, FB ;
MARION, JB .
PHYSICAL REVIEW, 1957, 108 (04) :1015-1019
[3]  
PAVLOV PV, 1967, SOV PHYS DOKL, V12, P11
[4]  
PAVLOV PV, 1966, SOV PHYS DOKL, V10, P786
[5]  
Pronko P. P., 1971, Radiation Effects, V10, P79, DOI 10.1080/00337577108231075
[6]   LATTICE DISORDER STUDIES IN LOW-TEMPERATURE NITROGEN-IMPLANTED SILICON [J].
PRONKO, PP ;
MITCHELL, JB ;
SHEWCHUN, J ;
DAVIES, JA .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1973, 20 (04) :257-263
[7]  
ROUGHAN PE, 1968, J ELECTROCHEM SOC, V115, pC74
[8]  
SCHWUTTKE GH, 1968, RADIATION EFFECTS SE, P406
[9]  
ZORIN EI, 1968, SOV PHYS SEMICOND+, V2, P111