MONITORING THE ARBITRARY THICKNESS OF OPTICAL THIN-FILMS AND THEIR ERROR SIMULATION - A METHOD

被引：3
作者：
ZHU, Z
LI, WS
HUA, YS
机构：
来源：
APPLIED OPTICS | 1985年 / 24卷 / 11期
关键词：
D O I：
10.1364/AO.24.001693
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
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页码：1693 / 1695
页数：3
相关论文
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