STRUCTURE OF SI2N2O

被引:113
作者
IDRESTEDT, I
BROSSET, C
机构
来源
ACTA CHEMICA SCANDINAVICA | 1964年 / 18卷 / 08期
关键词
D O I
10.3891/acta.chem.scand.18-1879
中图分类号
Q5 [生物化学]; Q7 [分子生物学];
学科分类号
071010 ; 081704 ;
摘要
引用
收藏
页码:1879 / +
页数:1
相关论文
共 9 条
[1]   The absorption factor in crystal spectroscopy [J].
Albrecht, G .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1939, 10 (08) :221-222
[2]   CRYSTAL STRUCTURE OF SILICON OXYNITRIDE SI2N2O [J].
BROSSET, C ;
IDRESTEDT, I .
NATURE, 1964, 201 (492) :1211-+
[3]  
FORGENG WD, 1958, T AM I MIN MET ENG, V212, P343
[4]   CRYSTAL STRUCTURES OF SILICON NITRIDE [J].
HARDIE, D ;
JACK, KH .
NATURE, 1957, 180 (4581) :332-333
[5]   THE PROBABILITY DISTRIBUTION OF X-RAY INTENSITIES .2. EXPERIMENTAL INVESTIGATION AND THE X-RAY DETECTION OF CENTRES OF SYMMETRY [J].
HOWELLS, ER ;
PHILLIPS, DC ;
ROGERS, D .
ACTA CRYSTALLOGRAPHICA, 1950, 3 (03) :210-214
[6]   Reciprocal Lorentz-polarization factor charts for equi-inclination Weissenberg photographs [J].
Lu, CS .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1943, 14 (11) :331-335
[7]   REFINEMENT OF ATOMIC PARAMETERS OF ALPHA-QUARTZ [J].
SMITH, GS ;
ALEXANDER, LE .
ACTA CRYSTALLOGRAPHICA, 1963, 16 (06) :462-&
[8]   Determination of absolute from relative X-ray intensity data [J].
Wilson, AJC .
NATURE, 1942, 150 :151-152
[9]  
1952, INTERNATIONAL TABLES, V1