AN EXACT TREATMENT OF SECONDARY AND TERTIARY FLUORESCENCE ENHANCEMENT IN PIXE

被引：25

作者：

CAMPBELL, JL

WANG, JX

MAXWELL, JA

TEESDALE, WJ

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 43卷 / 04期

关键词：

D O I：

10.1016/0168-583X(89)90404-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：539 / 555

页数：17

共 19 条

[1]

Abramowitz M., 1970, HDB MATH FNCTIONS

[2] ENHANCEMENT IN PIXE ANALYSIS [J].

AHLBERG, MS .

NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2) :61-65

[3]

Berger MJ, 1987, NBSIR873597

[4] PIXE ANALYSIS OF THICK TARGETS [J].

CAMPBELL, JL ;

COOKSON, JA .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) :185-197

[5] WIDTHS AND FLUORESCENCE YIELDS OF ATOMIC L-SHELL VACANCY STATES [J].

CHEN, MH ;

CRASEMANN, B ;

MARK, H .

PHYSICAL REVIEW A, 1981, 24 (01) :177-182

[6]

CHEN MH, 1985, ATOM DATA NUCL DATA, V33, P217

[7]

JOHANSSON SAE, 1988, PIXE NOVEL TECHNIQUE, P104

[8]

MAXWELL JA, IN PRESS NUCL INSTR

[9] ENHANCEMENT CORRECTION IN HIGH-ENERGY PARTICLE INDUCED X-RAY-EMISSION ANALYSIS [J].

MOMMSEN, H ;

SARKAR, M ;

SARTER, W ;

SCHMITTINGER, T .

NUCLEAR INSTRUMENTS & METHODS, 1979, 166 (03) :361-365

[10] QUANTITATIVE-ANALYSIS OF COMPLEX TARGETS BY PROTON-INDUCED X-RAYS [J].

REUTER, W ;

LURIO, A ;

CARDONE, F ;

ZIEGLER, JF .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) :3194-3202

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