DOUBLE SCATTERING IN COMPTON PROFILE MEASUREMENTS - ANALYTIC APPROACH

被引：14

作者：

PAATERO, P ^{[1
]}

HALONEN, V ^{[1
]}

机构：

[1] UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI,FINLAND

来源：

NUCLEAR INSTRUMENTS & METHODS | 1976年 / 135卷 / 03期

关键词：

D O I：

10.1016/0029-554X(76)90070-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：537 / 539

页数：3

共 11 条

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EPSTEIN, IR .

JOURNAL OF CHEMICAL PHYSICS, 1974, 61 (10) :4251-4257

[8] MULTIPLE-SCATTERING IN COMPTON-EFFECT .1. ANALYTIC TREATMENT OF ANGULAR-DISTRIBUTIONS AND TOTAL SCATTERING PROBABILITIES [J].

TANNER, AC ;

EPSTEIN, IR .

PHYSICAL REVIEW A, 1976, 13 (01) :335-348

[9] MULTIPLE SCATTERING OF X-RAYS BY AMORPHOUS SAMPLES [J].

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MOZZI, RL .

ACTA CRYSTALLOGRAPHICA, 1966, 21 :459-&

[10]

WEYRICH W, 1975, PHYS CHEM, V79, P11

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