PHOTODIODES;
DIODES;
SEMICONDUCTOR DEVICES AND MATERIALS;
D O I:
10.1049/el:19920631
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
The p+-cap layer was used to fabricate a metal-semiconductor-metal (MSM) interdigitated photodetector on Ga0.47In0.53As. The measured barrier height was PHI(Bn) = 0.52 V, the ideality factor n = 1.1 and average dark current density 2 mA/cm2. A rise time of 45 ps at lambda = 1.3-mu-m under 2 V bias was measured for an MSM photodiode with 3-mu-m finger width and finger gaps and an active area of 100 x 100-mu-m2.
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页码:992 / 995
页数:4
相关论文
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[1]
AVERIN SV, 1991, 1ST P INT SOV FIB OP, V1, P140