A PROCEDURE FOR X-RAY-FLUORESCENCE ANALYSIS IN THE SCANNING ELECTRON-MICROSCOPE

被引：0
|
作者：
BAHR, P [1 ]
GOLOB, P [1 ]
ZEDLACHER, H [1 ]
机构：
[1] ZENTRUM ELEKTRONENMIKROSKOPIE,A-8010 GRAZ,AUSTRIA
来源：
EUROPEAN JOURNAL OF CELL BIOLOGY | 1987年 / 44卷
关键词：
D O I：
暂无
中图分类号：
Q2 [细胞生物学];
学科分类号：
071009 ; 090102 ;
摘要：
引用
收藏
页码：4 / 4
页数：1
相关论文
共 50 条
  • [21] SCANNING ELECTRON-MICROSCOPY AND X-RAY-FLUORESCENCE ANALYSIS OF A FRACTIONATED URBAN AEROSOL
    BUTLER, JD
    CROSSLEY, P
    COLWILL, DM
    SCIENCE OF THE TOTAL ENVIRONMENT, 1981, 19 (02) : 179 - 194
  • [22] X-RAY MICROANALYSIS OF PRECIPITATES, USING A SCANNING ELECTRON-MICROSCOPE
    MATHY, H
    GREADY, T
    JOURNAL DE MICROSCOPIE, 1974, 19 (03): : A5 - A6
  • [23] METALLURGICAL APPLICATIONS OF X-RAY MICROANALYSIS IN SCANNING ELECTRON-MICROSCOPE
    DROST, N
    ZEEDIJK, HB
    JOURNAL DE MICROSCOPIE, 1974, 19 (03): : A3 - A3
  • [24] EVALUATING X-RAY-FILM IMAGES WITH THE SCANNING ELECTRON-MICROSCOPE
    SMITH, G
    COOK, T
    MATERIALS EVALUATION, 1986, 44 (09) : 25 - 26
  • [25] X-RAY-EMISSION ANALYSIS IN THE ELECTRON-MICROSCOPE
    JEFFERSON, DA
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1982, 305 (1491): : 535 - +
  • [26] SCANNING-TYPE X-RAY MICROSCOPY UTILIZING A SCANNING ELECTRON-MICROSCOPE
    TAKAHASHI, S
    MASUDA, T
    YADA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1984, 33 (03): : 308 - 308
  • [27] SCANNING ELECTRON-MICROSCOPE ATTACHMENT FOR ELECTRON-MICROSCOPE
    MIYAUCHI, K
    WATANABE, T
    KUBOZOE, M
    JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 256 - 256
  • [28] SOME ASPECTS OF ENERGY-DISPERSIVE X-RAY ANALYSIS IN A SCANNING ELECTRON-MICROSCOPE
    BLUM, F
    BRANDT, MP
    JOURNAL OF THE SOUTH AFRICAN CHEMICAL INSTITUTE, 1976, 29 (01): : 1 - 14
  • [29] ELECTRON-OPTICAL SYSTEM OF SCANNING ELECTRON-MICROSCOPE, X-RAY MICROANALYZER
    TOPORKOV, SA
    GELEVER, VD
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1988, 52 (07): : 1265 - 1268
  • [30] ELEMENTAL ANALYSIS IN THE SCANNING ELECTRON-MICROSCOPE
    HEYWOOD, JA
    AMERICAN LABORATORY, 1979, 11 (04) : 101 - &
12345