A NEW SPECIMEN HOLDER FOR UHV-REFLECTION ELECTRON-MICROSCOPY

A newly designed double-tilting specimen-holder was constructed for a UHV-reflection electron microscopy (REM). The specimen holder ensures the open space in front of the specimen surface, which enables the specimen to be irradiated by infrared light for specimen heating and by fast atom bombardment for surface modification, etc. Further, the specimen can be rotated 360 degrees around surface normal, allowing us to select a specific crystallographic orientation for REM observation in UHV. Preliminary REM observation was performed for Au-surface with considerable success. Details of construction of the specimen-holder are also presented.