BACKGROUND SUBTRACTION IN ELECTRON-SPECTROSCOPY BY USE OF REFLECTION ELECTRON-ENERGY LOSS SPECTRA

被引：15
|
作者：
CHORKENDORFF, I
TOUGAARD, S
机构：
[1] Odense Univ, Odense, Den, Odense Univ, Odense, Den
来源：
APPLIED SURFACE SCIENCE | 1987年 / 29卷 / 01期
关键词：
ELECTRONS - Reflection - SIGNAL FILTERING AND PREDICTION;
D O I：
10.1016/0169-4332(87)90018-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The use of reflected electron energy loss spectra (REELS) in deconvoluting the inelastic background signal from XPS and AES spectra from homogeneous samples is studied. It is demonstrated that under certain assumptions, the cross section for inelastic electron scattering can be extracted from a REELS spectrum. This cross section is applied to deconvolute an experimental XPS spectrum of aluminum. The method, its limitations and its relation to other methods are discussed.
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页码：101 / 112
页数：12
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