SECONDARY ION MASS-SPECTROMETRY (SIMS)

被引：2

作者：

STUCK, R

SIFFERT, P

机构：

来源：

PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1984年 / 8卷 / 1-2期

关键词：

D O I：

10.1016/0146-3535(84)90070-4

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：11 / 57

页数：47

共 50 条

[31] SECONDARY ION MASS-SPECTROMETRY (SIMS) OF STANDARDS FOR ANALYSIS OF SOFT BIOLOGICAL TISSUE
BURNSBELLHORN, MS
FILE, DM
[J]. ANALYTICAL BIOCHEMISTRY, 1979, 92 (01) : 213 - 221
[32] HIGH-RESOLUTION SECONDARY ION MASS-SPECTROMETRY (SIMS) FOR USE IN CHEMISTRY
KLOPPEL, KD
VONBUNAU, G
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 39 (01): : 85 - 93
[33] ANALYSIS OF CONDUCTING AND INSULATING SURFACES BY MEANS OF SECONDARY ION MASS-SPECTROMETRY (SIMS)
DEPAZ, M
MACCIO, C
[J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1975, 30 (6-7): : 831 - 834
[34] SECONDARY ION MASS-SPECTROMETRY
HEDBAVNY, P
[J]. CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1974, 24 (04): : C396 - 397
[35] SECONDARY ION MASS-SPECTROMETRY
MORRISON, GH
[J]. ANALYTICAL CHEMISTRY, 1986, 58 (01) : 1 - 1
[36] SECONDARY ION MASS-SPECTROMETRY
CAVALLINI, M
[J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1982, 7 (03): : A50 - A50
[37] SECONDARY ION MASS-SPECTROMETRY
KENWAYJACKSON, C
[J]. VACUUM, 1984, 34 (3-4) : 479 - 480
[38] SECONDARY ION MASS-SPECTROMETRY
WILLIAMS, P
[J]. ANNUAL REVIEW OF MATERIALS SCIENCE, 1985, 15 : 517 - 548
[39] ION-SCATTERING SPECTROSCOPY AND SECONDARY ION MASS-SPECTROMETRY (ISS/SIMS) STUDIES OF ZEOLITES
SUIB, SL
COUGHLIN, DF
OTTER, FA
CONOPASK, LF
[J]. JOURNAL OF CATALYSIS, 1983, 84 (02) : 410 - 422
[40] Quantitative secondary ion mass spectrometry (SIMS)
Schiffmann, Kirsten Ingolf
[J]. VAKUUM IN FORSCHUNG UND PRAXIS, 2014, 26 (02) : 27 - 35

← 1 2 3 4 5 →